SiC semiconductor evaluation test equipment
Achieve large-capacity testing with low power consumption! Waveform verification is possible under conditions close to the actual device installation state.
This device allows for evaluation tests close to real-world conditions without the need to mount SiC semiconductors or devices used in combination with SiC semiconductors onto actual equipment. Under conditions similar to those of actual equipment installation, it is possible to verify waveforms using various measuring instruments for loss, heat generation, noise, and durability. Additionally, due to its regenerative function, it enables large-capacity testing with low power consumption. It can also be applied to testing devices for automotive reactors, IGBTs, and IPMs other than SiC semiconductors. 【Features】 - Enables evaluation tests close to real-world conditions without mounting devices used in combination with SiC semiconductors onto actual equipment. - Allows verification of waveforms for loss, heat generation, noise, and durability using various measuring instruments under conditions similar to actual equipment installation. - Achieves large-capacity testing with low power consumption due to its regenerative function. - Can also be applied to testing devices for automotive reactors, IGBTs, and IPMs other than SiC semiconductors. *For more details, please refer to the PDF document or feel free to contact us.
- Company：東京精電
- Price：Other
